发明授权
- 专利标题: Method and apparatus for sputtering
- 专利标题(中): 溅射的方法和装置
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申请号: US686005申请日: 1984-12-24
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公开(公告)号: US4610770A公开(公告)日: 1986-09-09
- 发明人: Hiroshi Saito , Hideki Tateishi , Shigeru Kobayashi , Susumu Aiuchi , Yasumichi Suzuki , Masao Sakata , Hideaki Shimamura , Tsuneaki Kamei
- 申请人: Hiroshi Saito , Hideki Tateishi , Shigeru Kobayashi , Susumu Aiuchi , Yasumichi Suzuki , Masao Sakata , Hideaki Shimamura , Tsuneaki Kamei
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX58-243870 19831226
- 主分类号: C23C14/36
- IPC分类号: C23C14/36 ; C23C14/34 ; C23C14/35 ; C23C14/46 ; H01J37/34 ; H01L21/203 ; H01L21/31
摘要:
A pair of magnets for producing a mirror magnetic field are disposed outside of an electrode structure carrying a target. Microwaves from a microwave source are introduced toward and into a space defined by the mirror magnetic field for generating high-density plasma. While maintaining this high-density plasma over a wide area of the surface of the target, an electric field substantially perpendicular to the surface of the target is applied for sputtering of the target material. The optimized conditions for plasma generation can be selected when the high-density plasma formed outside of a processing chamber is guided to migrate toward an area above the target in the processing chamber. Capability of sputtering of the material from the entire surface of the target increases the rate of film deposition on a substrate and improves the target utilization rate (the quantity of the material deposited on the substrate/the usable area of the target).
公开/授权文献
- US5767511A Mean cluster size determination using water capture 公开/授权日:1998-06-16
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