发明授权
- 专利标题: Device and method for measuring optical properties
- 专利标题(中): 用于测量光学特性的装置和方法
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申请号: US897055申请日: 1986-08-15
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公开(公告)号: US4790664A公开(公告)日: 1988-12-13
- 发明人: Kenji Saito , Ken Eguchi , Haruki Kawada , Yoshinori Tomida , Takashi Nakagiri , Yukuo Nishimura , Kiyoshi Takimoto
- 申请人: Kenji Saito , Ken Eguchi , Haruki Kawada , Yoshinori Tomida , Takashi Nakagiri , Yukuo Nishimura , Kiyoshi Takimoto
- 申请人地址: JPX Tokyo
- 专利权人: Canon Kabushiki Kaisha
- 当前专利权人: Canon Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX60-179398 19850816; JPX60-179399 19850816; JPX60-179400 19850816; JPX60-281107 19851216; JPX60-281108 19851216; JPX60-281109 19851216; JPX60-281110 19851216
- 主分类号: G01N21/17
- IPC分类号: G01N21/17 ; G01N21/84 ; G01N21/00
摘要:
A device for measuring optical properties is provided which is equipped with an exciting light source for emitting exciting light to the sites to be measured of a sample, a light intensity modulator for modulating the exciting light, a probe light source for emitting probe light and a detector for receiving the probe light. The device is characterized by comprising an intensity distribution modifying means for bringing the maximum intensity portion of said probe light close to the sample when the probe light emitted from the probe light source reaches the site to be measured or the vicinity thereof. A method for measuring optical properties using the device is also provided. This device is useful particularly for measurement of the light absorption characteristics of a monomolecular film spread on a liquid surface.
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