发明授权
- 专利标题: Combined thermal analyzer and x-ray diffractometer
- 专利标题(中): 组合热分析仪和X射线衍射仪
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申请号: US105769申请日: 1987-10-06
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公开(公告)号: US4821303A公开(公告)日: 1989-04-11
- 发明人: Timothy G. Fawcett , William C. Harris, Jr. , Robert A. Newman , Lawrence F. Whiting , Frank J. Knoll
- 申请人: Timothy G. Fawcett , William C. Harris, Jr. , Robert A. Newman , Lawrence F. Whiting , Frank J. Knoll
- 申请人地址: MI Midland
- 专利权人: The Dow Chemical Company
- 当前专利权人: The Dow Chemical Company
- 当前专利权人地址: MI Midland
- 主分类号: G01N23/207
- IPC分类号: G01N23/207 ; G01N25/48 ; G01N23/20
摘要:
Scientific apparatus and a method are described for observing simultaneously both structural and thermodynamic properties of materials. An X-ray diffractometer and a thermal analyzer and mounted to cooperate and coact on the same sample and to complete a meaningful analysis in a very few minutes. The diffractometer is equipped with a rapid position-sensitive detector connected to a multichannel analyzer to record and display X-ray diffraction data from the sample over an angle of 20.degree. (two theta) or more. The thermal analyzer is preferably a differential scanning calorimeter. By correlating X-ray diffraction and thermal data taken simultaneously while the sample is passing through a range of temperatures and/or environments, structural changes corresponding to thermal events can be identified and elucidated.
公开/授权文献
- USD425692S Shoe upper 公开/授权日:2000-05-30