发明授权
- 专利标题: Film thickness-measuring apparatus using linearly polarized light
- 专利标题(中): 使用线偏振光的膜厚测量装置
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申请号: US62242申请日: 1987-06-11
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公开(公告)号: US4850711A公开(公告)日: 1989-07-25
- 发明人: Kazuo Sano , Takao Miyazaki , Yoshiro Yamada
- 申请人: Kazuo Sano , Takao Miyazaki , Yoshiro Yamada
- 申请人地址: JPX Tokyo
- 专利权人: Nippon Kokan Kabushiki Kaisha
- 当前专利权人: Nippon Kokan Kabushiki Kaisha
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX61-137458 19860613; JPX61-179145 19860730
- 主分类号: G01B11/06
- IPC分类号: G01B11/06 ; G01N21/21
摘要:
A linearly polarized light beam is applied to the surface of a film and is reflected therefrom. The beam is then split into three light beams by three or four optical flats. These light beams are applied to photoelectric conversion devices after passing through analyzers with fixed analyzing angles. The photoelectric conversion devices convert the beams into electric signals representing the intensities of these light beams. Two ellipsometric parameters .psi. and .DELTA. are calculated from these three electric signals.
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