发明授权
- 专利标题: Trench capacitor for large scale integrated memory
- 专利标题(中): 用于大规模集成存储器的TRENCH电容器
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申请号: US542573申请日: 1990-06-22
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公开(公告)号: US5075817A公开(公告)日: 1991-12-24
- 发明人: Douglas B. Butler
- 申请人: Douglas B. Butler
- 申请人地址: CO Colorado Springs
- 专利权人: Ramtron Corporation
- 当前专利权人: Ramtron Corporation
- 当前专利权人地址: CO Colorado Springs
- 主分类号: H01L27/04
- IPC分类号: H01L27/04 ; H01L21/822 ; H01L21/8242 ; H01L27/10 ; H01L27/108 ; H01L29/94
摘要:
A trench capacitor which has a plurality of capacitor plates separated by a dielectric within a trench on a substrate. A plate located closest to the wall of the trench may be a field shield and tied everywhere to ground. The other plate may be polysilicon. Said other plate may be tied to a source of variable potential. A plurality of sacrificial layers are established over the structure and the structure thus formed is then patterened and etched. A pass transistor is formed adjacent to the trench capacitor, and a connecting layer is established connecting the other plate of the trench capacitor to the source/drain region of the pass transistor. The connecting layer makes electrical contact to the other capacitor plate and source/drain of the pass transistor and is insulated from other layers in the capacitor and pass transistor. Bit lines and word lines can then be added, as known in the art.
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