发明授权
- 专利标题: Anisotropic tantalum pentoxide etch
- 专利标题(中): 各向异性五氧化二钽蚀刻
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申请号: US041302申请日: 1993-03-31
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公开(公告)号: US5312516A公开(公告)日: 1994-05-17
- 发明人: Monte A. Douglas , Howard R. Beratan , Scott R. Summerfelt
- 申请人: Monte A. Douglas , Howard R. Beratan , Scott R. Summerfelt
- 申请人地址: TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: TX Dallas
- 主分类号: C09K13/00
- IPC分类号: C09K13/00 ; C04B41/53 ; C23F1/04 ; G03F7/20 ; H01L21/02 ; H01L21/311 ; B44C1/22 ; C23F1/00
摘要:
A tantalum pentoxide substrate 34 immersed in a liquid ambient (e.g. 10% hydrofluoric acid 30) and illuminated with radiation (e.g. collimated visible/ultraviolet radiation 24) produced by a radiation source (e.g. a 200 Watt mercury xenon arc lamp 20). A window 26 which is substantially transparent to the collimated radiation 24 allows the radiated energy to reach the Ta.sub.2 O.sub.5 substrate 34. An etch mask (e.g. organic photoresist 32) may be positioned between the radiation source 20 and the substrate 34. The Ta.sub.2 O.sub.5 substrate 34 and liquid ambient 30 are maintained at a nominal temperature (e.g. 25.degree. C.). Without illumination, the Ta.sub.2 O.sub.5 is not appreciably etched by the liquid ambient. Upon illumination the etch rate is substantially increased.
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