发明授权
- 专利标题: Method and apparatus for thermal conductivity measurements
- 专利标题(中): 热导率测量方法和装置
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申请号: US85646申请日: 1993-06-30
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公开(公告)号: US5335993A公开(公告)日: 1994-08-09
- 发明人: Sanford M. Marcus , Michael Reading
- 申请人: Sanford M. Marcus , Michael Reading
- 申请人地址: DE New Castle
- 专利权人: TA Instruments, Inc.
- 当前专利权人: TA Instruments, Inc.
- 当前专利权人地址: DE New Castle
- 主分类号: G01N25/20
- IPC分类号: G01N25/20 ; G01N25/18 ; G01N25/48 ; G01Q90/00
摘要:
A method and apparatus for measuring the thermal conductivity of materials using modulated differential scanning calorimetry (MDSC). Two MDSC heat capacity measurements are made consecutively. One measurement is made under conditions which ensure obtaining a fairly accurate value for the heat capacity of the material ("quasi-ideal conditions"). Another measurement is made under conditions such that the measured effective heat capacity differs from the accurate value of the heat capacity due to thermal conductivity effects. Generally, the non-ideal conditions differ from the ideal conditions by one parameter, such as the size of the sample, the modulation frequency used to measure the heat capacity, or, for thin films, the presence or absence of a specimen on the thin film. The thermal conductivity of the material is then calculated from the difference between the heat capacity measured under quasi-ideal conditions and the effective heat capacity measured under non-ideal conditions.
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