Invention Grant
- Patent Title: Metalorganic chemical vapor deposition of layered structure oxides
- Patent Title (中): 层状结构氧化物的金属有机化学气相沉积
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Application No.: US300339Application Date: 1994-09-02
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Publication No.: US5478610APublication Date: 1995-12-26
- Inventor: Seshu B. Desu , W. Tao
- Applicant: Seshu B. Desu , W. Tao
- Applicant Address:
- Assignee: Ceram Incorporated,Sharp Kabushiki,Virginia Polytechnic Institute and State University
- Current Assignee: Ceram Incorporated,Sharp Kabushiki,Virginia Polytechnic Institute and State University
- Current Assignee Address:
- Main IPC: C23C16/40
- IPC: C23C16/40 ; H01L21/02 ; H01L21/311 ; H01L21/314 ; H01L21/316 ; B05D3/06
Abstract:
A method of fabricating high quality layered structure oxide ferroelectric thin films. The deposition process is a chemical vapor deposition process involving chemical reaction between volatile metal organic compounds of various elements comprising the layered structure material to be deposited, with other gases in a reactor, to produce a nonvolatile solid that deposits on a suitably placed substrate such as a conducting, semiconducting, insulating, or complex integrated circuit substrate. The source materials for this process may include organometallic compounds such as alkyls, alkoxides, .beta.-diketonates or metallocenes of each individual element comprising the layered structure material to be deposited and oxygen. Preferably, the reactor in which the deposition is done is either a hot wall or a cold wall reactor and the vapors are introduced into this reactor either through a set of bubblers or through a direct liquid injection system. The ferroelectric films can be used for device applications such as in capacitors, dielectric resonators, heat sensors, transducers, actuators, nonvolatile memories, optical waveguides and displays.
Public/Granted literature
- US5012259A Color recorder with gas laser beam scanning Public/Granted day:1991-04-30
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