发明授权
US5560002A Method of testing a microprocessor by masking of an internal clock signal
失效
通过屏蔽内部时钟信号来测试微处理器的方法
- 专利标题: Method of testing a microprocessor by masking of an internal clock signal
- 专利标题(中): 通过屏蔽内部时钟信号来测试微处理器的方法
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申请号: US534596申请日: 1995-09-27
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公开(公告)号: US5560002A公开(公告)日: 1996-09-24
- 发明人: James P. Kardach , Tosaku Nakanishi , Jimmy S. Cheng
- 申请人: James P. Kardach , Tosaku Nakanishi , Jimmy S. Cheng
- 申请人地址: CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: CA Santa Clara
- 主分类号: G06F1/04
- IPC分类号: G06F1/04 ; G06F1/10 ; G06F1/26 ; G06F11/00 ; G06F11/267 ; G06F1/14
摘要:
An apparatus and method for controlling the stopping of the clock signal utilized by the processing unit of a computer system comprises the use of a novel external pin which can be enabled to initiate a sequence of events that results in the halting of the internal clock signal. The invention includes a microcode engine that responds to the assertion of the external pin by executing a sequence of steps which stops the current instruction on an instruction boundary. A logic circuit then generates a signal that masks the clock signal produced by the system's phase-locked loop. An interrupt mechanism is also utilized to prioritize the occurrence of the external signal among other system interrupts. The interrupt mechanism insures that the processor never has its clock stopped in the middle of a bus cycle.
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