发明授权
- 专利标题: Dry cleaning process for cleaning a surface
- 专利标题(中): 用于清洁表面的干洗过程
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申请号: US3384申请日: 1993-01-12
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公开(公告)号: US5578133A公开(公告)日: 1996-11-26
- 发明人: Rinji Sugino , Masaki Okuno , Yasuhisa Sato
- 申请人: Rinji Sugino , Masaki Okuno , Yasuhisa Sato
- 申请人地址: JPX Kawasaki
- 专利权人: Fujitsu Limited
- 当前专利权人: Fujitsu Limited
- 当前专利权人地址: JPX Kawasaki
- 优先权: JPX4-004162 19920113; JPX4-195041 19920722
- 主分类号: C23F4/00
- IPC分类号: C23F4/00 ; C23G5/00 ; H01L21/00 ; H01L21/302 ; H01L21/304 ; H01L21/306 ; H01L21/3065 ; H01L21/311 ; B08B5/00 ; C03C23/00 ; C23F1/00
摘要:
A dry cleaning process for removing metal contaminants from a surface of an oxide film includes the steps of: forming a reaction area on the oxide film such that a silicon surface is formed in correspondence to the reaction area, supplying a dry cleaning gas selected from a group essentially consisting of chlorine, bromine, hydrogen chloride, hydrogen bromide and a mixture thereof, to the oxide film including the reaction area, to produce silicon halide molecules as a result of a reaction between the dry cleaning gas and the silicon surface, supplying the silicon halide molecules to a surface of the oxide film, and removing metal elements existing on the surface of the oxide film as a result of a reaction between the metal element and the dry cleaning gas under a presence of the silicon halide molecules.
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