- 专利标题: Structure and method including dry etching techniques for forming an array of thermal sensitive elements
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申请号: US367659申请日: 1995-01-03
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公开(公告)号: US5626773A公开(公告)日: 1997-05-06
- 发明人: James F. Belcher , Howard R. Beratan , Scott R. Summerfelt
- 申请人: James F. Belcher , Howard R. Beratan , Scott R. Summerfelt
- 申请人地址: TX Dallas
- 专利权人: Texas Instruments Incorporated
- 当前专利权人: Texas Instruments Incorporated
- 当前专利权人地址: TX Dallas
- 主分类号: G01J1/02
- IPC分类号: G01J1/02 ; G01J5/34 ; H01L21/302 ; H01L21/3065 ; H01L27/14 ; H01L37/02 ; B44C1/22 ; C03C15/00 ; C03C25/06 ; C23F1/00
摘要:
An array of thermal sensor elements (16) is formed from a pyroelectric substrate (46) having an infrared absorber and common electrode assembly (18) attached thereto. A first layer of metal contacts (60) is formed to define masked (61) and unmasked (68) regions of the substrate (46). A second layer of metal contacts (62) is formed on the first layer of contacts (60). A radiation etch mask layer (66) is formed to encapsulate the exposed portions of the second layer of contacts (62). A dry-etch mask layer (74) is formed to encapsulate the exposed portions of the first layer of contacts (60) and radiation etch mask layer (66). An initial portion of each unmasked region (68) is etched using a dry-etch process. The remaining portions of the unmasked regions (68) are exposed to an etchant (70) and irradiated with electromagnetic energy to substantially increase the reactivity between the remaining portions and the etchant (70). During such irradiation, the etchant (70) etches the remaining portions substantially faster than the first layer of contacts (60) and the radiation etch mask layer (66).
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