发明授权
- 专利标题: Method for testing an on-chip cache for repair
- 专利标题(中): 用于测试片上缓存进行修复的方法
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申请号: US523297申请日: 1995-09-05
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公开(公告)号: US5680544A公开(公告)日: 1997-10-21
- 发明人: John Edmondson , Scott Taylor
- 申请人: John Edmondson , Scott Taylor
- 申请人地址: MA Maynard
- 专利权人: Digital Equipment Corporation
- 当前专利权人: Digital Equipment Corporation
- 当前专利权人地址: MA Maynard
- 主分类号: G06F11/267
- IPC分类号: G06F11/267 ; G11C29/34 ; G11C29/38 ; G11C29/44 ; G11C29/56 ; G11C29/00
摘要:
A test system is provided which tests the on chip cache of a microprocessor (CPU). The test system provides test vectors to the CPU in a specified sequences. The CPU then uses its internal general purpose registers to write the vectors the cache memory locations. After writing, the data is read back and compared to an expected value. The results are then stored in other general purpose registers of the CPU. Using the CPUs general purpose registers to record the test results allows the test system to test many cache locations in parallel. Furthermore the test system allows the test to proceed in a fixed number of CPU clock cycles regardless of any detected errors.
公开/授权文献
- US4485151A Thermal barrier coating system 公开/授权日:1984-11-27
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