Invention Grant
- Patent Title: Semiconductor integrated circuit device allowing change of product specification and chip screening method therewith
- Patent Title (中): 半导体集成电路器件允许改变产品规格和芯片筛选方法
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Application No.: US683780Application Date: 1996-07-16
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Publication No.: US5812481APublication Date: 1998-09-22
- Inventor: Kenji Numata , Masaki Ogihara
- Applicant: Kenji Numata , Masaki Ogihara
- Applicant Address: JPX Kawasaki
- Assignee: Kabushiki Kaisha Toshiba
- Current Assignee: Kabushiki Kaisha Toshiba
- Current Assignee Address: JPX Kawasaki
- Priority: JPX3-219926 19910830; JPX4-221694 19920820
- Main IPC: G11C11/406
- IPC: G11C11/406 ; G11C5/00 ; G11C7/10 ; G11C11/401 ; G11C11/407 ; G11C11/408 ; G11C29/00 ; G11C29/44 ; G11C29/50 ; G11C29/56 ; H01L27/10 ; G11C8/00
Abstract:
A semiconductor memory device includes a buffer for outputting an address signal and a decoding circuit having an input for receiving the address signal. A switch electrically connects the buffer to the input of the decoding circuit if a refresh mode specifying signal specifies a first data refresh mode, and electrically disconnects the buffer from the input of the decoding circuit if the refresh mode specifying signal specifies a second data refresh mode different from the first data refresh mode. An activating/deactivating circuit activates the input of the decoding circuit if the refresh mode specifying signal specifies the first data refresh mode and deactivates the input of the decoding circuit if the refresh mode specifying signal specifies the second data refresh mode.
Public/Granted literature
- US5170839A Method for determining and regulating the level of a bath of molten metal Public/Granted day:1992-12-15
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