发明授权
- 专利标题: Gaussian beam profile shaping apparatus, method therefor and evaluation thereof
- 专利标题(中): 高斯光束轮廓成形装置及其评估方法
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申请号: US711783申请日: 1996-09-10
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公开(公告)号: US5864430A公开(公告)日: 1999-01-26
- 发明人: Fred M. Dickey , Scott C. Holswade , Louis A. Romero
- 申请人: Fred M. Dickey , Scott C. Holswade , Louis A. Romero
- 申请人地址: NM Albuquerque
- 专利权人: Sandia Corporation
- 当前专利权人: Sandia Corporation
- 当前专利权人地址: NM Albuquerque
- 主分类号: B23K26/06
- IPC分类号: B23K26/06 ; B23K26/073 ; G02B27/09 ; H01S3/00 ; G02B27/46 ; B23K26/00 ; H01S3/10
摘要:
A method and apparatus maps a Gaussian beam into a beam with a uniform irradiance profile by exploiting the Fourier transform properties of lenses. A phase element imparts a design phase onto an input beam and the output optical field from a lens is then the Fourier transform of the input beam and the phase function from the phase element. The phase element is selected in accordance with a dimensionless parameter which is dependent upon the radius of the incoming beam, the desired spot shape, the focal length of the lens and the wavelength of the input beam. This dimensionless parameter can also be used to evaluate the quality of a system. In order to control the radius of the incoming beam, optics such as a telescope can be employed. The size of the target spot and the focal length can be altered by exchanging the transform lens, but the dimensionless parameter will remain the same. The quality of the system, and hence the value of the dimensionless parameter, can be altered by exchanging the phase element. The dimensionless parameter provides design guidance, system evaluation, and indication as to how to improve a given system.
公开/授权文献
- US5340715A Multiple surface evanescent wave sensor with a reference 公开/授权日:1994-08-23
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