发明授权
- 专利标题: Method of manufacturing through holes in a semiconductor device
- 专利标题(中): 在半导体器件中制造通孔的方法
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申请号: US977347申请日: 1997-11-24
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公开(公告)号: US6022797A公开(公告)日: 2000-02-08
- 发明人: Shigeo Ogasawara , Shigeru Takahashi , Noriaki Oka , Tadayasu Miki , Masahito Hiroshima
- 申请人: Shigeo Ogasawara , Shigeru Takahashi , Noriaki Oka , Tadayasu Miki , Masahito Hiroshima
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX8-320005 19961129
- 主分类号: H01L21/28
- IPC分类号: H01L21/28 ; H01L21/60 ; H01L21/768 ; H01L21/82 ; H01L21/822 ; H01L23/485 ; H01L23/522 ; H01L27/04 ; H01L27/118 ; H01L21/4763 ; H01L23/48
摘要:
First through holes of a relatively small diameter and second through holes of a relatively great diameter are formed in proper shapes by separate processes, respectively, in a first layer insulating film. The second through holes are tapered toward a layer underlying the first layer insulating film. First, the first through holes are formed in the first layer insulating film, the first through holes are filled up with plug electrodes, and the second through holes are formed in the first layer insulating film. When filling up the first and the second through holes formed in the first layer insulating film with plug electrodes, a first conductive film deposited over the first layer insulating film is etched back to fill up the first through holes with the plug electrodes, and then etch back residues remaining on the side walls of the second through holes are removed.
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