发明授权
- 专利标题: MIS SOI semiconductor device with RTD and/or HET
- 专利标题(中): 具有RTD和/或HET的MIS SOI半导体器件
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申请号: US955267申请日: 1997-10-21
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公开(公告)号: US6091077A公开(公告)日: 2000-07-18
- 发明人: Kiyoyuki Morita , Kiyoshi Morimoto , Koichiro Yuki , Kiyoshi Araki
- 申请人: Kiyoyuki Morita , Kiyoshi Morimoto , Koichiro Yuki , Kiyoshi Araki
- 申请人地址: JPX Osaka
- 专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人: Matsushita Electric Industrial Co., Ltd.
- 当前专利权人地址: JPX Osaka
- 优先权: JPX8-279091 19961022
- 主分类号: H01L21/762
- IPC分类号: H01L21/762 ; H01L21/84 ; H01L27/12 ; H01L29/76 ; H01L29/88 ; H01L29/06
摘要:
The invention provides a semiconductor device, having a variety of functions such as a bistable memory and a logic circuit, in which a MOS semiconductor element, a resonance tunnel diode, a hot electron transistor and the like are formed on a common substrate. An n-type Si layer and a p-type Si layer surrounded with an isolation oxide film are formed on an SOI substrate. A mask oxide film and a gate oxide film are formed, and the n-type Si layer is subjected to crystal anisotropic etching by using the mask oxide film as a mask, so as to change the n-type Si layer into the shape of a thin Si plate. After first and second tunnel oxide films are formed on side faces of this n-type Si layer, first and second polysilicon electrodes of a resonance tunnel diode and a polysilicon electrode working as a gate electrode of a MOS semiconductor element are formed out of a common polysilicon film. Thus, a Si/SiO.sub.2 type quantum device can be manufactured with ease at a low cost.
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