发明授权
- 专利标题: Ion trap mass spectrometer
- 专利标题(中): 离子阱质谱仪
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申请号: US143398申请日: 1998-08-28
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公开(公告)号: US6157030A公开(公告)日: 2000-12-05
- 发明人: Minoru Sakairi , Tadao Mimura , Toshihiro Ishizuka , Masaru Tomioka , Yasuaki Takada , Takayuki Nabeshima
- 申请人: Minoru Sakairi , Tadao Mimura , Toshihiro Ishizuka , Masaru Tomioka , Yasuaki Takada , Takayuki Nabeshima
- 申请人地址: JPX Tokyo
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: JPX Tokyo
- 优先权: JPX9-235760 19970901; JPX9-235769 19970901
- 主分类号: H01J49/42
- IPC分类号: H01J49/42
摘要:
Disclosed is an ion trap mass spectrometer improved to obtain a high sensitivity without the lowering of resolution. By fitting a mesh electrode to an aperture (an ion sampling aperture or an ion extracting aperture) made in endcap electrodes constituting an ion trap mass analysis region, a radio frequency electric field in the mass analysis region is not disturbed even if the diameter of the aperture is set to a large value to heighten ion transmission efficiency. By fitting a shield electrode for preventing collision of ions with an insulated ring constituting an outer wall of the mass analysis region, charging up of the insulated ring is prevented to improve stability of detection signals. Furthermore, by arranging a shield member for shielding stray charged particles detouring through the circumference of the mass analysis region to approach an ion detector, generation of noises based on these stray charged particles is prevented.
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