发明授权
US06194236B1 Electrochemical etching method for silicon substrate having PN junction
有权
具有PN结的硅衬底的电化学蚀刻方法
- 专利标题: Electrochemical etching method for silicon substrate having PN junction
- 专利标题(中): 具有PN结的硅衬底的电化学蚀刻方法
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申请号: US09247908申请日: 1999-02-11
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公开(公告)号: US06194236B1公开(公告)日: 2001-02-27
- 发明人: Minekazu Sakai , Tsuyoshi Fukada , Yukihiko Tanizawa , Koki Mizuno , Yasutoshi Suzuki , Yoshitsugu Abe , Hiroshi Tanaka , Motoki Ito , Kazuhisa Ikeda , Hiroshi Okada
- 申请人: Minekazu Sakai , Tsuyoshi Fukada , Yukihiko Tanizawa , Koki Mizuno , Yasutoshi Suzuki , Yoshitsugu Abe , Hiroshi Tanaka , Motoki Ito , Kazuhisa Ikeda , Hiroshi Okada
- 优先权: JP6-42839 19940314; JP7-98949 19950424; JP7-239927 19950919
- 主分类号: H01L2166
- IPC分类号: H01L2166
摘要:
An etching method for a silicon substrate, which can easily smooth the etching surface of the (110)-oriented silicon, is disclosed. A container is filled with KOH solution. In the KOH solution is immersed a (110)-oriented silicon wafer having a PN junction and is also disposed a platinum electrode plate to face the silicon wafer. To between a platinum electrode of the silicon wafer and the platinum electrode plate are connected a constant voltage power source, an ammeter and a contact in series. A controller starts etching from one surface on which the PN junction is formed, and terminates voltage application when the specified time lapses after the formation of an anodic oxide film is equilibrated with the etching of the anodic oxide film on the etching surface on the PN junction part. In this case, the controller detects flowing current through the ammeter, and the point of time when the equilibrium state is obtained is the point of inflection of the detected current to the constant current after the peak thereof.
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