发明授权
- 专利标题: SOI bonding structure
- 专利标题(中): SOI结合结构
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申请号: US09123364申请日: 1998-07-28
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公开(公告)号: US06255731B1公开(公告)日: 2001-07-03
- 发明人: Tadahiro Ohmi , Nobuyoshi Tanaka , Takeo Ushiki , Toshikuni Shinohara , Takahisa Nitta
- 申请人: Tadahiro Ohmi , Nobuyoshi Tanaka , Takeo Ushiki , Toshikuni Shinohara , Takahisa Nitta
- 优先权: JP9-204518 19970730
- 主分类号: H01L2348
- IPC分类号: H01L2348
摘要:
A semiconductor substrate adapted to giga-scale integration (GSI) comprises a support, at least the surface of which is made of semiconductor, an electroconductive material layer, an insulating layer and a semiconductor layer arranged sequentially in the above order. The electroconductive material layer has at least in part thereof an electroconductive reacted layer obtained by causing two metals, a metal and a semiconductor, a metal and a metal-semiconductor compound, a semiconductor and a metal-semiconductor compound, or two metal-semiconductor compounds to react each other. An electroconductive reaction terminating layer that is made of a material that does not react with the reacted layer is arranged between the reacted layer and the insulating layer or the support.
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