- 专利标题: Selective nitride etching with silicate ion pre-loading
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申请号: US09213143申请日: 1998-12-18
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公开(公告)号: US06287983B1公开(公告)日: 2001-09-11
- 发明人: Der'E Jan , Thomas M. Parrill , Brian K. Kirkpatrick
- 申请人: Der'E Jan , Thomas M. Parrill , Brian K. Kirkpatrick
- 主分类号: H01L21302
- IPC分类号: H01L21302
摘要:
A nitride wet etch in which liquid TEOS is flowed directly into the hot phosphoric acid bath before wafer etching begins. This preloads the bath chemistry with silicate ions, and thus helps assure very high selectivity to silicon oxides.
公开/授权文献
- US20010001728A1 SELECTIVE NITRIDE ETCHING WITH SILICATE ION PRE-LOADING 公开/授权日:2001-05-24
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