Invention Grant
US06380100B2 Semiconductor processing apparatuses, and methods of forming antireflective coating materials over substrates 失效
半导体处理装置以及在基板上形成抗反射涂层材料的方法

  • Patent Title: Semiconductor processing apparatuses, and methods of forming antireflective coating materials over substrates
  • Patent Title (中): 半导体处理装置以及在基板上形成抗反射涂层材料的方法
  • Application No.: US09859203
    Application Date: 2001-05-15
  • Publication No.: US06380100B2
    Publication Date: 2002-04-30
  • Inventor: J. Brett RolfsonRodney C. Langley
  • Applicant: J. Brett RolfsonRodney C. Langley
  • Main IPC: H01L2131
  • IPC: H01L2131
Semiconductor processing apparatuses, and methods of forming antireflective coating materials over substrates
Abstract:
In one aspect, the invention encompasses an apparatus for semiconductor processing comprising: a) at least one support member comprising an upper surface for supporting a semiconductor wafer; b) a component through which the support member extends, the component comprising a front surface and a back surface, at least one of the support member and the component being movable relative to the other of the support member and the component such that the support member can support a wafer in an elevated position above the front surface and can be withdrawn into the component to lower the wafer relative to the front surface of the component; and c) a block joined to the support member below the component back surface, the block engaging the component back surface when the support member upper surface extends above the component to a predetermined distance, the block preventing the support member upper surface from extending beyond the front surface by more than the predetermined distance. In other aspects, the invention encompasses semiconductor processing methods, such as, for example, methods utilizing the above-described apparatus.
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