Invention Grant
- Patent Title: Apparatus for and method of measuring a peak jitter
- Patent Title (中): 用于测量峰值抖动的装置和方法
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Application No.: US09538135Application Date: 2000-03-29
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Publication No.: US06460001B1Publication Date: 2002-10-01
- Inventor: Takahiro Yamaguchi , Masahiro Ishida , Mani Soma
- Applicant: Takahiro Yamaguchi , Masahiro Ishida , Mani Soma
- Main IPC: G06F1900
- IPC: G06F1900

Abstract:
An input clock signal is transformed into a complex analytic signal zc(t) by an analytic signal transforming means 13 and an instantaneous phase of its real part xc(t) is estimated using the analytic signal zc(t). A linear phase is removed from the instantaneous phase to obtain a phase noise waveform &Dgr;&phgr;(t). A peak value &Dgr;&phgr;max of absolute values of the &Dgr;&phgr;(t) is obtained, and 4&Dgr;&phgr;max is defined as the worst value of period jitter of the input signal. The &Dgr;&phgr;(t) is sampled at a timing close to a zero-crossing point of the xc(t) to extract the sample value. A differential between adjacent samples is obtained in the sequential order to calculate a root-mean-square value of the differentials (period jitters). An exp(−(2&Dgr;&phgr;max)2/(2&sgr;j2)) is calculated from the mean-square value &sgr;j and 2&Dgr;&phgr;max, and the calculated value is defined as a probability that a period jitter exceeds 2&Dgr;&phgr;max.
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