发明授权
US06519176B1 Dual threshold SRAM cell for single-ended sensing 失效
用于单端感测的双阈值SRAM单元

Dual threshold SRAM cell for single-ended sensing
摘要:
A six transistor SRAM cell for single-ended sensing is described along with related memory architecture. The cell comprises a bistable circuit connected to complementary bit lines through a pair of passgate transistors. One of the passgate transistors has a lower threshold voltage than the other transistor. The lower threshold voltage is used to couple the cell to a single-ended sense amplifier through one of the bit lines. In one embodiment fewer than all the bit lines in an array are precharged in order to reduce power consumption in the array.
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