发明授权
- 专利标题： Semiconductor device and semiconductor device testing method
- 专利标题（中）： 半导体器件和半导体器件测试方法
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申请号： US09764415申请日： 2001-01-19
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公开(公告)号： US06643809B2公开(公告)日： 2003-11-04
- 发明人: Hiroyoshi Tsuboi , Shinya Fujioka
- 申请人： Hiroyoshi Tsuboi , Shinya Fujioka
- 优先权： JP2000-054879 20000229
- 主分类号： G01R328
- IPC分类号： G01R328
摘要：
A semiconductor device which has a test mode for testing the semiconductor device, is provided with a circuit which generates a first signal based on dummy command signals which are input thereto a plurality of times, and generates a second signal which instructs entry to a corresponding test mode or an exit from a corresponding test mode based on an address signal and the first signal.
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