- 专利标题: Attenuated embedded phase shift photomask blanks
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申请号: US10303341申请日: 2002-11-22
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公开(公告)号: US06730445B2公开(公告)日: 2004-05-04
- 发明人: Marie Angelopoulos , Katherina Babich , S. Jay Chey , Michael Straight Hibbs , Robert N. Lang , Arpan Pravin Mahorowala , Kenneth Christopher Racette
- 申请人: Marie Angelopoulos , Katherina Babich , S. Jay Chey , Michael Straight Hibbs , Robert N. Lang , Arpan Pravin Mahorowala , Kenneth Christopher Racette
- 主分类号: G03F900
- IPC分类号: G03F900
摘要:
An attenuating embedded phase shift photomask blank that produces a phase shift of the transmitted light is formed with an optically translucent film made of metal, silicon, nitrogen and oxygen. An etch stop layer is added to improve the etch selectivity of the phase shifting layer. A wide range of optical transmission (0.001% up to 15% at 157 nm) is obtained by this process.
公开/授权文献
- US20030194569A1 Attenuated embedded phase shift photomask blanks 公开/授权日:2003-10-16
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