发明授权
US06753202B2 CMOS photodiode having reduced dark current and improved light sensitivity and responsivity
有权
CMOS光电二极管具有降低的暗电流和改善的光敏度和响应性
- 专利标题: CMOS photodiode having reduced dark current and improved light sensitivity and responsivity
- 专利标题(中): CMOS光电二极管具有降低的暗电流和改善的光敏度和响应性
-
申请号: US10446910申请日: 2003-05-28
-
公开(公告)号: US06753202B2公开(公告)日: 2004-06-22
- 发明人: Zhiliang J. Chen , Kuok Y. Ling , Hisashi Shichijo , Katsuo Komatsuzaki , Chin-Yu Tsai
- 申请人: Zhiliang J. Chen , Kuok Y. Ling , Hisashi Shichijo , Katsuo Komatsuzaki , Chin-Yu Tsai
- 主分类号: H01L2100
- IPC分类号: H01L2100
摘要:
A method for the fabrication of a light-sensing diode in a high-resistivity semiconductor substrate. A high-energy implant of ions into the substrate is patterned to form an annular well of the same conductivity type as the substrate; followed by a second high-energy implant of the opposite conductivity type, within the center of the annulus; followed by a third implant, of lower energy and high dosage, to form a region of the first conductivity type extending laterally near the substrate surface. The resulting diode junction is thereby patterned to include two planes near the substrate surface, allowing incident light to traverse the junction twice.
公开/授权文献
信息查询