发明授权
US06753202B2 CMOS photodiode having reduced dark current and improved light sensitivity and responsivity 有权
CMOS光电二极管具有降低的暗电流和改善的光敏度和响应性

CMOS photodiode having reduced dark current and improved light sensitivity and responsivity
摘要:
A method for the fabrication of a light-sensing diode in a high-resistivity semiconductor substrate. A high-energy implant of ions into the substrate is patterned to form an annular well of the same conductivity type as the substrate; followed by a second high-energy implant of the opposite conductivity type, within the center of the annulus; followed by a third implant, of lower energy and high dosage, to form a region of the first conductivity type extending laterally near the substrate surface. The resulting diode junction is thereby patterned to include two planes near the substrate surface, allowing incident light to traverse the junction twice.
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