发明授权
- 专利标题: Combinational equivalence checking methods and systems with internal don't cares
- 专利标题(中): 组合等价检查方法和内部系统不需要关心
-
申请号: US10230976申请日: 2002-08-28
-
公开(公告)号: US06842884B2公开(公告)日: 2005-01-11
- 发明人: Yung-Te Lai , Chioumin Chang , Kung-Chien Chen , Chih-Chang Lin
- 申请人: Yung-Te Lai , Chioumin Chang , Kung-Chien Chen , Chih-Chang Lin
- 申请人地址: US CA Milpitas
- 专利权人: Verplex Systems, Inc.
- 当前专利权人: Verplex Systems, Inc.
- 当前专利权人地址: US CA Milpitas
- 代理机构: Heller Ehrman White & McAuliffe
- 代理商 Paul Davis
- 主分类号: G06F17/50
- IPC分类号: G06F17/50
摘要:
An equivalence checking method provides first and second logic functions. Don't care gates are inserted for don't care conditions in the first and second logic functions. The insertion of the don't care gates creates a first intermediate circuit and a second intermediate circuit. All 3DC gates of the first intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. All 3DC gates of the second intermediate circuit are propagated and merged into a single 3DC gate when 3DC gates and SDC gates coexist in either of the first and second intermediate circuits. First and second circuits are produced in response to propagating and merging the 3DC gates. A combinational equivalence check is then performed of the first circuit to the second circuit under different equivalence relations.
公开/授权文献
信息查询