发明授权
- 专利标题： Remaining lifetime estimating method, temperature detecting structure and electronic equipment
- 专利标题（中）： 剩余寿命估算方法，温度检测结构和电子设备
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申请号： US10361843申请日： 2003-02-11
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公开(公告)号： US06880967B2公开(公告)日： 2005-04-19
- 发明人: Masashi Isozumi , Tsunetoshi Oba
- 申请人： Masashi Isozumi , Tsunetoshi Oba
- 申请人地址： JP Kyoto
- 专利权人： Omron Corporation
- 当前专利权人： Omron Corporation
- 当前专利权人地址： JP Kyoto
- 代理机构： Foley & Lardner LLP
- 优先权： JP2002-044630 20020221
- 主分类号： G01K3/04
- IPC分类号： G01K3/04 ; G01K7/00 ; H01G9/00 ; H01G13/00 ; H02M3/28
摘要：
A temperature of an electrolytic capacitor 24 incorporated in equipment is detected, a remaining lifetime in actual use is calculated based on a temperature-lifetime law, and the remaining lifetime is indicated. A thin film tape 23 is wound around a temperature sensor 22 for insulation, and the electrolytic capacitor 24 and the temperature sensor 22 are accommodated in a heat-shrinkable tube 25, the secondary temperature sensor 22 is brought into tight contact with the primary electrolytic capacitor 24.
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