Remaining lifetime estimating method, temperature detecting structure and electronic equipment
    1.
    发明授权
    Remaining lifetime estimating method, temperature detecting structure and electronic equipment 有权
    剩余寿命估算方法,温度检测结构和电子设备

    公开(公告)号:US06880967B2

    公开(公告)日:2005-04-19

    申请号:US10361843

    申请日:2003-02-11

    摘要: A temperature of an electrolytic capacitor 24 incorporated in equipment is detected, a remaining lifetime in actual use is calculated based on a temperature-lifetime law, and the remaining lifetime is indicated. A thin film tape 23 is wound around a temperature sensor 22 for insulation, and the electrolytic capacitor 24 and the temperature sensor 22 are accommodated in a heat-shrinkable tube 25, the secondary temperature sensor 22 is brought into tight contact with the primary electrolytic capacitor 24.

    摘要翻译: 检测装在设备中的电解电容器24的温度,根据温度 - 寿命定律计算实际使用的剩余寿命,并指示剩余寿命。 薄膜带23缠绕在温度传感器22上用于绝缘,电解电容器24和温度传感器22容纳在热收缩管25中,二次温度传感器22与初级电解电容器 24。

    Power supply unit
    3.
    发明授权
    Power supply unit 有权
    供电单元

    公开(公告)号:US06809923B2

    公开(公告)日:2004-10-26

    申请号:US10361846

    申请日:2003-02-11

    IPC分类号: H05K500

    CPC分类号: H05K7/1432

    摘要: The power supply unit comprises a power supply circuit accommodating chamber A and an arithmetic circuit accommodating chamber B partitioned from each other by a partition wall, and power supply circuit substrates 7 and 8 and an arithmetic circuit substrate 12 are accommodated in the power supply circuit accommodating chamber A and the arithmetic circuit accommodating chamber B, respectively. A connector of the power supply circuit substrate 8 and a connector of the arithmetic circuit substrate 12 are connected to each other through the partition wall of the power supply circuit accommodating chamber A and the arithmetic circuit accommodating chamber B.

    摘要翻译: 电源单元包括电源电路容纳室A和通过分隔壁彼此分隔的运算电路容纳室B,并且电源电路基板7,8和运算电路基板12容纳在电源电路容纳 室A和运算电路容纳室B。 电源电路基板8的连接器和运算电路基板12的连接器通过电源电路容纳室A的分隔壁和运算电路容纳室B相互连接。