Invention Grant
US06888624B2 Method for measuring polarization dependent loss and insertion loss
有权
用于测量偏振相关损耗和插入损耗的方法
- Patent Title: Method for measuring polarization dependent loss and insertion loss
- Patent Title (中): 用于测量偏振相关损耗和插入损耗的方法
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Application No.: US10398318Application Date: 2002-02-08
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Publication No.: US06888624B2Publication Date: 2005-05-03
- Inventor: Stéphane Caplette , Sylvain Cloutier , Charles Massicotte , Alain Villeneuve
- Applicant: Stéphane Caplette , Sylvain Cloutier , Charles Massicotte , Alain Villeneuve
- Applicant Address: CA Montreal CA Montreal
- Assignee: ITF Technologies Optiques Inc.,ITF Optical Technologies Inc.
- Current Assignee: ITF Technologies Optiques Inc.,ITF Optical Technologies Inc.
- Current Assignee Address: CA Montreal CA Montreal
- Agent George J. Primak
- Priority: CA2336753 20010214
- International Application: PCTCA02/00160 WO 20020208
- International Announcement: WO0206508 WO 20020822
- Main IPC: G01M11/00
- IPC: G01M11/00 ; G01N21/00
![Method for measuring polarization dependent loss and insertion loss](/abs-image/US/2005/05/03/US06888624B2/abs.jpg.150x150.jpg)
Abstract:
This invention provides a method of obtaining accurate measurements of polarization dependent loss and insertion loss during the tests aiming at measuring the polarization properties of optical components. This is achieved by taking into account every polarization disturbance in the line between generation of known states of polarization and the device under test. The method involves computing within a desired range of wavelengths either the transfer matrix of each polarization perturbing element or of all polarization perturbing elements as a whole, and compensating for errors introduced by these polarization perturbing elements.
Public/Granted literature
- US20040001202A1 Method for measuring polarization dependent loss and insertion loss Public/Granted day:2004-01-01
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