公开(公告)号：US06888624B2

公开(公告)日：2005-05-03

申请号：US10398318

申请日：2002-02-08

申请人： Stéphane Caplette ,  Sylvain Cloutier ,  Charles Massicotte ,  Alain Villeneuve

发明人： Stéphane Caplette ,  Sylvain Cloutier ,  Charles Massicotte ,  Alain Villeneuve

IPC分类号： G01M11/00 ,  G01N21/00

CPC分类号： G01M11/00 ,  G01M11/33 ,  G01M11/337

摘要： This invention provides a method of obtaining accurate measurements of polarization dependent loss and insertion loss during the tests aiming at measuring the polarization properties of optical components. This is achieved by taking into account every polarization disturbance in the line between generation of known states of polarization and the device under test. The method involves computing within a desired range of wavelengths either the transfer matrix of each polarization perturbing element or of all polarization perturbing elements as a whole, and compensating for errors introduced by these polarization perturbing elements.

摘要翻译： 本发明提供了一种在针对测量光学部件的偏振特性的测试期间获得精确测量偏振相关损耗和插入损耗的方法。 这是通过考虑在已知的极化状态的产生和被测器件之间的线中的每个极化扰动来实现的。 该方法涉及在期望的波长范围内计算每个偏振扰动元件的传递矩阵或者所有极化扰动元件的整体，并补偿由这些偏振扰动元件引入的误差。