Invention Grant
- Patent Title: XRR detector readout processing
- Patent Title (中): XRR检测器读出处理
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Application No.: US10635365Application Date: 2003-08-06
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Publication No.: US06895071B2Publication Date: 2005-05-17
- Inventor: Boris Yokhin , Alexander Dikopoltsev , Isaac Mazor , David Berman
- Applicant: Boris Yokhin , Alexander Dikopoltsev , Isaac Mazor , David Berman
- Applicant Address: IL Migdal Haemek
- Assignee: Jordon Valley Applied Radiation, Ltd.
- Current Assignee: Jordon Valley Applied Radiation, Ltd.
- Current Assignee Address: IL Migdal Haemek
- Agency: Amster, Rothstein & Ebenstein LLP
- Main IPC: G01B15/02
- IPC: G01B15/02 ; G01N23/20 ; G01N23/223 ; G01T1/36

Abstract:
Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.
Public/Granted literature
- US20040028186A1 X-ray reflectometer Public/Granted day:2004-02-12
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