发明授权
- 专利标题: XRR detector readout processing
- 专利标题(中): XRR检测器读出处理
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申请号: US10635365申请日: 2003-08-06
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公开(公告)号: US06895071B2公开(公告)日: 2005-05-17
- 发明人: Boris Yokhin , Alexander Dikopoltsev , Isaac Mazor , David Berman
- 申请人: Boris Yokhin , Alexander Dikopoltsev , Isaac Mazor , David Berman
- 申请人地址: IL Migdal Haemek
- 专利权人: Jordon Valley Applied Radiation, Ltd.
- 当前专利权人: Jordon Valley Applied Radiation, Ltd.
- 当前专利权人地址: IL Migdal Haemek
- 代理机构: Amster, Rothstein & Ebenstein LLP
- 主分类号: G01B15/02
- IPC分类号: G01B15/02 ; G01N23/20 ; G01N23/223 ; G01T1/36
摘要:
Reflectometry apparatus includes a radiation source, adapted to irradiate a sample with radiation over a range of angles relative to a surface of the sample, and a detector assembly, positioned to receive the radiation reflected from the sample over the range of angles and to generate a signal responsive thereto. A shutter is adjustably positionable to intercept the radiation, the shutter having a blocking position, in which it blocks the radiation in a lower portion of the range of angles, thereby allowing the reflected radiation to reach the array substantially only in a higher portion of the range, and a clear position, in which the radiation in the lower portion of the range reaches the array substantially without blockage.
公开/授权文献
- US20040028186A1 X-ray reflectometer 公开/授权日:2004-02-12
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