发明授权
- 专利标题: Substrate plating apparatus
- 专利标题(中): 基板电镀装置
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申请号: US09945711申请日: 2001-09-05
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公开(公告)号: US06929722B2公开(公告)日: 2005-08-16
- 发明人: Akihisa Hongo , Naoaki Ogure , Hiroaki Inoue , Norio Kimura , Fumio Kuriyama , Manabu Tsujimura , Kenichi Suzuki , Atsushi Chono
- 申请人: Akihisa Hongo , Naoaki Ogure , Hiroaki Inoue , Norio Kimura , Fumio Kuriyama , Manabu Tsujimura , Kenichi Suzuki , Atsushi Chono
- 申请人地址: JP Tokyo
- 专利权人: Ebara Corporation
- 当前专利权人: Ebara Corporation
- 当前专利权人地址: JP Tokyo
- 代理机构: Wenderoth, Lind & Ponack, L.L.P.
- 优先权: JP9-270493 19970917; JP10-71370 19980305; JP10-96974 19980326; JP10-205138 19980721
- 主分类号: C25D7/12
- IPC分类号: C25D7/12 ; H01L21/00 ; H01L21/288 ; H01L21/768 ; C25D17/00 ; H01M4/29 ; C23B3/00
摘要:
A substrate plating apparatus forms an interconnection layer on an interconnection region composed of a fine groove and/or a fine hole defined in a substrate. The substrate plating apparatus includes a plating unit for forming a plated layer on a surface of the substrate including the interconnection region, a chemical mechanical polishing unit for chemically mechanically polishing the substrate to remove the plated layer from the surface of the substrate leaving a portion of the plated layer in the interconnection region, a cleaning unit for cleaning the substrate after the plated layer is formed or the substrate is chemically mechanically polished, a drying unit for drying the substrate after the substrate is cleaned, and a substrate transfer unit for transferring the substrate to and from each of the first plating unit, the first chemical mechanical polishing unit, the cleaning unit, and the drying unit. The first plating unit, the first chemical mechanical polishing unit, the cleaning unit, the drying unit, and the substrate transfer unit are combined into a unitary arrangement.
公开/授权文献
- US20020005359A1 Substrate plating apparatus 公开/授权日:2002-01-17
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