发明授权
US06931606B1 Automatic method and system for instantiating built-in-test (BIST) modules in ASIC memory designs
失效
用于在ASIC存储器设计中实例化内置测试（BIST）模块的自动方法和系统
- 专利标题： Automatic method and system for instantiating built-in-test (BIST) modules in ASIC memory designs
- 专利标题（中）： 用于在ASIC存储器设计中实例化内置测试（BIST）模块的自动方法和系统
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申请号： US09978141申请日： 2001-10-15
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公开(公告)号： US06931606B1公开(公告)日： 2005-08-16
- 发明人: Yaron Kretchmer , Michael Porter , Thomas OBrien
- 申请人： Yaron Kretchmer , Michael Porter , Thomas OBrien
- 申请人地址： US CA Milpitas
- 专利权人： LSI Logic Corporation
- 当前专利权人： LSI Logic Corporation
- 当前专利权人地址： US CA Milpitas
- 代理机构： Sawyer Law Group
- 主分类号： G01R31/28
- IPC分类号： G01R31/28 ; G06F9/45 ; G06F17/50 ; G11C29/12
摘要：
A method and system for automatically instantiating built-in-system test (BIST) modules in memory designs is disclosed. The method and system include providing a server over a network that integrates a set of design tools, including an automated front-end software process and an automated back-end software process. According to the method and system, a user may access the server over the network and enter a request for a memory design. The front-end software process is then executed to automatically generate a netlist of a BIST from the user request. Thereafter, the back-end software process is executed to automatically generate a placement and route view of the BIST.
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