Invention Grant
- Patent Title: Instrument for high throughput measurement of material physical properties and method of using same
- Patent Title (中): 用于材料物理性能高通量测量的仪器及其使用方法
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Application No.: US09779149Application Date: 2001-02-08
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Publication No.: US06936471B2Publication Date: 2005-08-30
- Inventor: Damian Hajduk , Eric Carlson , J. Christopher Freitag , Oleg Kolosov , James R. Engstrom , Adam Safir , Ravi Srinivasan , Leonid Matsiev
- Applicant: Damian Hajduk , Eric Carlson , J. Christopher Freitag , Oleg Kolosov , James R. Engstrom , Adam Safir , Ravi Srinivasan , Leonid Matsiev
- Applicant Address: US CA Santa Clara
- Assignee: Symyx Technologies, Inc.
- Current Assignee: Symyx Technologies, Inc.
- Current Assignee Address: US CA Santa Clara
- Agency: Dobrusin & Thennisch, PC
- Main IPC: G01N11/00
- IPC: G01N11/00 ; B01L3/00 ; G01N1/28 ; G01N3/02 ; G01N3/08 ; G01N3/20 ; G01N3/32 ; G01N5/00 ; G01N19/00 ; G01N29/02 ; G01N29/22 ; G01N37/00 ; G01N31/00 ; G01N3/00

Abstract:
An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.
Public/Granted literature
- US20020029621A1 Instrument for high throughput measurement of material physical properties and method of using same Public/Granted day:2002-03-14
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