发明授权
US06940301B2 Test pad array for contact resistance measuring of ACF bonds on a liquid crystal display panel
有权
用于在液晶显示面板上进行ACF键接触电阻测量的测试垫阵列
- 专利标题: Test pad array for contact resistance measuring of ACF bonds on a liquid crystal display panel
- 专利标题(中): 用于在液晶显示面板上进行ACF键接触电阻测量的测试垫阵列
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申请号: US10734371申请日: 2003-12-12
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公开(公告)号: US06940301B2公开(公告)日: 2005-09-06
- 发明人: Hui-Chang Chen
- 申请人: Hui-Chang Chen
- 申请人地址: TW
- 专利权人: Au Optronics Corporation
- 当前专利权人: Au Optronics Corporation
- 当前专利权人地址: TW
- 代理机构: Duane Morris LLP
- 主分类号: G01R31/28
- IPC分类号: G01R31/28 ; G01R27/02 ; G01R27/20 ; G01R31/00 ; G01R31/04 ; G01R31/26 ; G09G3/00 ; H01L21/60
摘要:
A test pad array and dummy lead array for measuring anisotropic conductive film bond contact resistance on a liquid crystal display panel. The test pad and dummy lead arrays are provided on a surface of the liquid crystal display panel. The test pad array is electrically connected to a group of terminal pads disposed on the surface of the panel, which are electrically connected to an electronic device with anisotropic conductive film bonds. The test pad array allows the contact resistance of one or more of the anisotropic conductive film bonds to be measured on the panel. The dummy lead array is provided for electrically connecting a second electronic device to the panel. The dummy lead array is electrically connected to the test pad array such that a contact resistance of at least one anisotropic conductive film bond associated with the second electronic device can be measured on the panel using portions of the test pad array electrically connected to the dummy lead array.
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