发明授权
- 专利标题: Method of manufacturing a vertical semiconductor device
- 专利标题(中): 制造垂直半导体器件的方法
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申请号: US10880048申请日: 2004-06-29
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公开(公告)号: US06949434B2公开(公告)日: 2005-09-27
- 发明人: Yoshifumi Okabe , Masami Yamaoka , Akira Kuroyanagi
- 申请人: Yoshifumi Okabe , Masami Yamaoka , Akira Kuroyanagi
- 申请人地址: JP Kariya
- 专利权人: Denso Corporation
- 当前专利权人: Denso Corporation
- 当前专利权人地址: JP Kariya
- 代理机构: Harness, Dickey & Pierce, PLC
- 优先权: JP2-33367 19900214
- 主分类号: H01L21/28
- IPC分类号: H01L21/28 ; H01L21/285 ; H01L21/304 ; H01L21/336 ; H01L29/06 ; H01L29/167 ; H01L29/34 ; H01L29/417 ; H01L29/45 ; H01L29/76 ; H01L29/78 ; H01L29/94 ; H01L31/062 ; H01L21/3205 ; H01L21/44
摘要:
A method of manufacturing a vertical semiconductor device includes preparing a semiconductor wafer which has a heavily doped semiconductor substrate and a lightly doped semiconductor layer disposed over the semiconductor substrate, forming a semiconductor element at a surface portion of the semiconductor layer, forming a first metal layer for a first electrode of the semiconductor element over the surface portion of the semiconductor layer, grinding a back of the semiconductor substrate to thin the semiconductor substrate and roughen a back surface of the semiconductor substrate, performing a wet etching upon the back surface; and forming on the back surface a second metal layer for a second electrode of the semiconductor element.
公开/授权文献
- US20040237327A1 Semiconductor device and method of manufacturing same 公开/授权日:2004-12-02
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