发明授权
- 专利标题: Observation and/or failure inspection apparatus, method and program therefor
- 专利标题(中): 观察和/或故障检查装置,方法和程序
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申请号: US10636860申请日: 2003-08-07
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公开(公告)号: US06973395B2公开(公告)日: 2005-12-06
- 发明人: Yutaka Yoshizawa , Kazuhiro Sakaguchi
- 申请人: Yutaka Yoshizawa , Kazuhiro Sakaguchi
- 申请人地址: JP Kanagawa
- 专利权人: NEC Electronics Corporation
- 当前专利权人: NEC Electronics Corporation
- 当前专利权人地址: JP Kanagawa
- 代理商 Darryl G. Walker; Bradley T. Sako
- 优先权: JP2002-235952 20020813
- 主分类号: G01R31/26
- IPC分类号: G01R31/26 ; G01R23/16 ; G01R29/26 ; G06F19/00
摘要:
An observation apparatus according to one embodiment can include a timing generating unit (2) that generates a timing signal at a predetermined period. A sampling unit (3) can sample a current observation signal of a power supply current on the basis of the timing signal, and store sampled data in data storing unit (5). A data number adjusting unit (6) can adjust the number of data samples to a number that is a power of two. An arithmetic operating unit (4) can Fourier-transform the adjusted data to generate frequency spectrum results of the current observation signal. In addition, a failure inspection apparatus according to one embodiment analyzes the frequency spectrum of an integrated circuit under observation to determine a failure condition of the integrated circuit.