公开(公告)号：US06973395B2

公开(公告)日：2005-12-06

申请号：US10636860

申请日：2003-08-07

申请人： Yutaka Yoshizawa ,  Kazuhiro Sakaguchi

发明人： Yutaka Yoshizawa ,  Kazuhiro Sakaguchi

IPC分类号： G01R31/26 ,  G01R23/16 ,  G01R29/26 ,  G06F19/00

CPC分类号： G01R29/26

摘要： An observation apparatus according to one embodiment can include a timing generating unit (2) that generates a timing signal at a predetermined period. A sampling unit (3) can sample a current observation signal of a power supply current on the basis of the timing signal, and store sampled data in data storing unit (5). A data number adjusting unit (6) can adjust the number of data samples to a number that is a power of two. An arithmetic operating unit (4) can Fourier-transform the adjusted data to generate frequency spectrum results of the current observation signal. In addition, a failure inspection apparatus according to one embodiment analyzes the frequency spectrum of an integrated circuit under observation to determine a failure condition of the integrated circuit.

摘要翻译： 根据一个实施例的观察装置可以包括定时产生单元（2），其在预定周期产生定时信号。 采样单元（3）可以基于定时信号对电源电流的当前观测信号进行采样，并将采样数据存储在数据存储单元（5）中。 数据编号调整单元（6）可以将数据样本的数量调整为2的幂数。 算术运算单元（4）可对经调整的数据进行傅立叶变换，生成当前观测信号的频谱结果。 此外，根据一个实施例的故障检查装置分析观察中的集成电路的频谱，以确定集成电路的故障状态。

公开(公告)号：US06996489B2

公开(公告)日：2006-02-07

申请号：US09796451

申请日：2001-03-02

申请人： Kazuhiro Sakaguchi

发明人： Kazuhiro Sakaguchi

IPC分类号： G01R31/28

CPC分类号： G01R31/31935 ,  G01R31/3004

摘要： An apparatus for sampling a power supply current value for performing frequency analysis of the power supply current flowing in an integrated circuit with a test signal applied to the integrated circuit has a power supply generating a prescribed supply of power for the integrated circuit (DUT: device under test), a current detection means for observing the power supply current value supplied from the power supply to the DUT, a test signal generation means for generating a prescribed test signal to be applied to an input/output terminal other than a power supply terminal of the DUT and for generating a test signal application signal during application of the test signal to the DUT, a sampling means for sampling the power supply current value signal, a sampling time determining means for instructing the sampling means with regard to the start and end timing for sampling, based on the test signal application signal, a sampling data storage means for storing data sampled by the sampling means, a Fourier transform means for performing a Fourier transformation calculation on the sampled data, and a main control means for outputting instructions to various other means and performing overall apparatus control.

公开(公告)号：US6058502A

公开(公告)日：2000-05-02

申请号：US145236

申请日：1998-09-01

申请人： Kazuhiro Sakaguchi

发明人： Kazuhiro Sakaguchi

IPC分类号： G01R31/30 ,  G06F11/00 ,  G06F13/28

CPC分类号： G01R31/3004

摘要： A diagnosis system for a semiconductor integrated circuit repeatedly applies a test pattern at repetition periods so as to measure variation of electric power supplied to the semiconductor integrated circuit, and determines the magnitude of a spectral component at a fundamental frequency equal to the inverse of the repetition period and the magnitude of each spectral component at each harmonic of the fundamental frequency to see whether the spectral components fall within the magnitude ranges observed in an excellent semiconductor integrated circuit device so that the diagnosis is speedy and reliable.

摘要翻译： 半导体集成电路的诊断系统在重复周期重复地施加测试图案，以便测量提供给半导体集成电路的电力的变化，并且确定基本频率等于重复的倒数的频谱分量的大小 周期以及基频的每个谐波处的每个频谱分量的大小，以查看频谱分量是否落在在优秀的半导体集成电路器件中观察到的幅度范围内，从而诊断速度可靠。

公开(公告)号：US08011011B2

公开(公告)日：2011-08-30

申请号：US11007398

申请日：2004-12-08

申请人： Kazuhiro Sakaguchi

发明人： Kazuhiro Sakaguchi

IPC分类号： G06F7/04

CPC分类号： G06F21/10 ,  G06F21/6218 ,  G06F21/74 ,  G06F21/78 ,  G06F2221/2105

摘要： A data processing apparatus for processing and protecting data stored in a removable storage medium, including a medium monitoring unit configured to monitor the state of the removable storage medium, an information storage unit configured to store information, and a controller configured to move the data from the removable storage medium to the information storage unit in accordance with the monitoring result of the medium monitoring unit.

摘要翻译： 一种用于处理和保护存储在可移动存储介质中的数据的数据处理装置，包括被配置为监视可移动存储介质的状态的介质监视单元，被配置为存储信息的信息存储单元和被配置为将数据从 所述可移动存储介质根据所述介质监视单元的监视结果传送到所述信息存储单元。

公开(公告)号：US06510289B2

公开(公告)日：2003-01-21

申请号：US09875964

申请日：2001-06-08

申请人： Yoshihide Terao ,  Kazuhiro Sakaguchi ,  Tetsuya Yokoyama

发明人： Yoshihide Terao ,  Kazuhiro Sakaguchi ,  Tetsuya Yokoyama

IPC分类号： G03G1500

CPC分类号： H04N1/32678 ,  G03G15/5087 ,  G03G15/6508 ,  G03G2215/00734 ,  H04N1/2307 ,  H04N1/2338 ,  H04N1/2353 ,  H04N1/32635

摘要： The present invention relates to an image formation system for forming images of read original images, a control method of the image formation system, image formation apparatuses, a storage medium thereof. According to the present invention, sheets of which size corresponds to an attribute of the images are selected, and it is detected whether or not the image formation apparatus has the sheets selected by the image formation apparatus. When it is detected that the image formation apparatus does not have the selected sheets, sheets other than the selected sized sheets are selected as sheets used in forming images by the image formation apparatus, and it is controlled that another image formation apparatus performs an image formation using the sheets other than the selected sized sheets.

摘要翻译： 本发明涉及一种用于形成读取的原始图像的图像的图像形成系统，图像形成系统的控制方法，图像形成装置，其存储介质。 根据本发明，选择尺寸对应于图像的属性的片材，并且检测图像形成装置是否具有由图像形成装置选择的片材。 当检测到图像形成装置不具有所选择的片材时，除了所选择的尺寸的片材之外的片材被选择为由图像形成装置形成图像所使用的片材，并且被控制为另一个图像形成装置执行图像形成 使用除了所选尺寸的纸张之外的纸张。

公开(公告)号：US06766485B1

公开(公告)日：2004-07-20

申请号：US09669113

申请日：2000-09-25

申请人： Kazuhiro Sakaguchi

发明人： Kazuhiro Sakaguchi

IPC分类号： G01R3128

CPC分类号： G01R31/31924 ,  G01R31/3004 ,  G01R31/31721

摘要： A unit test signal having duration T is repeatedly supplied from an LSI tester to an IC under test and, simultaneously, a power source current is supplied from the LSI tester through a current detection unit to the IC under test. The power source current is monitored by the current detection unit and a current information obtained by the monitoring is analyzed by a spectrum analyzer unit. Since the repetition period of the test signal is T, the power source current having a period nT flows through the IC under test along with a state shift of the IC under test, where n is an integer. When the IC under test has a fault, the power source current flows with a period n′T, where n′ is an integer different from n, or an abnormal power source current flows with the period nT, due to a change of the state shift of the IC under test. A decision unit performs a fault decision of the IC under test by judging an existence of abnormal power source current or the change of the state shift of the IC under test on the basis of values of spectral power in the vicinity of a frequency 1/nT and high harmonics thereof of the power source current or existence or absence of peak having such period.

摘要翻译： 具有持续时间T的单元测试信号从LSI测试器重复地提供给被测试的IC，同时，从LSI测试器通过电流检测单元将电源电流提供给被测IC。 由电流检测单元监视电源电流，并通过频谱分析仪单元分析通过监视获得的电流信息。 由于测试信号的重复周期为T，所以具有周期nT的电源电流随着被测试IC的状态偏移而流经所测试的IC，其中n是整数。 当被测IC处于故障状态时，由于状态的变化，电源电流以不是n的整数而不是n的整数周期流动，或异常的电源电流以期间nT流动 移动IC被测试。 决定单元通过根据频率1 / nT附近的频谱功率的值判断异常电源电流的存在或被测IC的状态偏移的变化来进行被测IC的故障判定 其电源电流的高次谐波或具有这种周期的峰的存在或不存在。

公开(公告)号：US06694274B2

公开(公告)日：2004-02-17

申请号：US10320441

申请日：2002-12-17

申请人： Kazuhiro Sakaguchi

发明人： Kazuhiro Sakaguchi

IPC分类号： G01R2316

CPC分类号： G01R31/2851 ,  G01R31/3004 ,  G01R31/31721

摘要： Detecting failed integrated circuit among integrated circuits, by (a) assuming that all integrated circuits under test define under-test set, and testing each one of the integrated circuits in the under-test set, (b) removing integrated circuits judged to be in failure in step (a) from the under-test set, (c) measuring spectrum of a current supplied from a power source into each one of integrated circuits in under-test set, (d) calculating both mean value and standard deviation of spectrum for under-test set, (e) judging whether an integrated circuit is in failure or not, based on both the mean value and the standard deviation of the spectrum, (f) removing integrated circuits having been judged to be in failure in step (e), from the under-test set, and (g) judging under-test set to be in no failure. Thus, it possible to find failed integrated circuits without preparing data of integrated circuit in no failure, as a reference.

摘要翻译： 检测集成电路中的故障集成电路，方法是：（a）假设所有被测试集成电路定义欠载测试集，并测试欠测试集中的每一个集成电路，（b）去除被认为在 步骤（a）从欠测试组中失败，（c）测量从电源提供给电流不足的集成电路中的电流的频谱，（d）计算频谱的平均值和标准偏差 （e）基于频谱的平均值和标准偏差来判断集成电路是否发生故障，（f）去除已经被判断为失败的集成电路（步骤 e），来自不足的测试集，（g）判断测试集不会失败。 因此，可以在没有故障的情况下找到集成电路的数据而找到故障的集成电路，作为参考。

公开(公告)号：US06684170B2

公开(公告)日：2004-01-27

申请号：US10320499

申请日：2002-12-17

申请人： Kazuhiro Sakaguchi

发明人： Kazuhiro Sakaguchi

IPC分类号： G01R2316

CPC分类号： G01R31/2851 ,  G01R31/3004 ,  G01R31/31721

摘要： There is provided a method of detecting an integrated circuit in failure among integrated circuits, based on spectrum which is a result of analyzing a frequency of a current running through an integrated circuit when a test signal is applied to the integrated circuit, comprising the steps of (a) assuming that all integrated circuits under test define a under-test integrated circuit set, and testing each one of the integrated circuits in the under-test integrated circuit set in a conventional manner, (b) removing integrated circuits having been judged to be in failure in the step (a), from the under-test integrated circuit set, (c) measuring spectrum of a current supplied from a power source into each one of the integrated circuits in the under-test integrated circuit set, (d) calculating both a mean value and standard deviation of the spectrum for the under-test integrated circuit set, (e) judging whether an integrated circuit is in failure or in no failure, based on both the mean value and the standard deviation of the spectrum, (f) removing integrated circuits having been judged to be in failure in the step (e), from the under-test integrated circuit set, and (g) judging the under-test integrated circuit set to be in no failure. The method makes it possible to find integrated circuits in failure without preparing data of an integrated circuit in no failure, as a reference.

摘要翻译： 通过（a）假定所有被测试集成电路定义欠载测试集，并测试被测设备中的每一个集成电路，（b）去除被判断为故障的集成电路，检测集成电路中的故障集成电路 在步骤（a）中，（c）测试从电源提供给电流不足的集成电路中的电流的频谱，（d）计算频谱的平均值和标准偏差 （e）基于频谱的平均值和标准偏差来判断集成电路是否发生故障，（f）在步骤（e）中去除被判断为失败的集成电路 ），来自测试下的集合，（g）判断测试集不会失败。 因此，可以在不准备集成电路的数据的情况下找到故障的集成电路，作为参考。

公开(公告)号：US06480011B2

公开(公告)日：2002-11-12

申请号：US09859478

申请日：2001-05-18

申请人： Kazuhiro Sakaguchi

发明人： Kazuhiro Sakaguchi

IPC分类号： G01R3128

CPC分类号： G01R31/319

摘要： A method of screening LSIs is provided, which makes it possible to screen out faulty LSIs before potential failure existing therein is elicited. A specific power supply voltage is supplied to LSIs to be tested while applying a specific test signal to the LSIs at a specific period. Power supply currents of the LSIs are observed. Sets of power spectrum data of the power supply currents are generated corresponding to the test signal. The distributions of the sets of power spectrum data are generated. whether or not the distributions of the sets of power spectrum data of the power supply currents are equal to or greater than a specific reference value is judged. When the distribution of the set of power spectrum data of the power supply current of one of the devices is equal is to or greater than the reference value, the device in question is regarded as a faulty one.

摘要翻译： 提供了一种屏蔽LSI的方法，可以在其中存在潜在的故障之前屏蔽有缺陷的LSI。 特定电源电压被提供给要测试的LSI，同时在特定的周期向LSI施加特定的测试信号。 观察到LSI的电源电流。 根据测试信号生成电源电流的功率谱数据集。 产生功率谱数据集的分布。 判断电源电流的功率谱数据组的分布是否等于或大于特定参考值。 当一个设备的电源电流的功率谱数据集合的分布等于或大于参考值时，被认为是有问题的设备。

公开(公告)号：US07970817B2

公开(公告)日：2011-06-28

申请号：US11123953

申请日：2005-05-06

申请人： Tadashi Hagiuda ,  Masao Hayashi ,  Kentaro Saito ,  Yoichi Takaragi ,  Akio Ito ,  Kazuhiro Sakaguchi

发明人： Tadashi Hagiuda ,  Masao Hayashi ,  Kentaro Saito ,  Yoichi Takaragi ,  Akio Ito ,  Kazuhiro Sakaguchi

IPC分类号： G06F15/16

CPC分类号： G06Q10/10 ,  G06F2216/17 ,  H04L51/14 ,  H04L51/28

摘要： An information processing method includes a storing step of storing a correspondence between destination names and e-mail addresses in a storage unit; a setting step of setting a destination name to which a document is to be transmitted; and an upload step of uploading the document to a document management server for a network printing in accordance with an e-mail address corresponding to the set destination name, a document being uploaded to the document management server and then being output in response to an output request from an owner of the e-mail address in the network printing. The uploaded document can be downloaded from the document management server to a printer through a communication medium and can be printed.

摘要翻译： 信息处理方法包括存储步骤，用于在存储单元中存储目的地名称和电子邮件地址之间的对应关系; 设置要发送文档的目的地名称的设置步骤; 以及上传步骤，根据与设定的目的地名称相对应的电子邮件地址将文档上传到文档管理服务器进行网络打印，将文档上传到文档管理服务器，然后响应于输出而被输出 在网络打印中请求电子邮件地址的所有者。 上传的文件可以通过通信介质从文件管理服务器下载到打印机，并可以打印。