发明授权
US06975184B2 Adjusting the frequency of film bulk acoustic resonators 有权
调整膜体声波谐振器的频率

Adjusting the frequency of film bulk acoustic resonators
摘要:
A material may be removed from the top electrode of a film bulk acoustic resonator to alter the mass loading effect and to adjust the frequency of one film bulk acoustic resonator on a wafer relative to other resonators on the same wafer. Similarly, the piezoelectric layer or the bottom electrode may be selectively milled with a focused ion beam to trim the resonator.
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