发明授权
- 专利标题： Method and apparatus for checking the resistance of programmable elements
- 专利标题（中）： 用于检查可编程元件电阻的方法和装置
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申请号： US09777036申请日： 2001-02-05
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公开(公告)号： US06983404B2公开(公告)日： 2006-01-03
- 发明人: Douglas J. Cutter , Adrian E. Ong , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
- 申请人： Douglas J. Cutter , Adrian E. Ong , Fan Ho , Kurt D. Beigel , Brett M. Debenham , Dien Luong , Kim Pierce , Patrick J. Mullarkey
- 申请人地址： US ID Boise
- 专利权人： Micron Technology, Inc.
- 当前专利权人： Micron Technology, Inc.
- 当前专利权人地址： US ID Boise
- 代理机构： Fletcher Yoder P.C.
- 主分类号： G11C29/00
- IPC分类号： G11C29/00
摘要：
Method and apparatus are disclosed for checking the resistance of antifuse elements in an integrated circuit. A voltage based on the resistance of an antifuse element is compared to a voltage based on a known resistance, and an output signal is generated whose binary value indicates whether the resistance of the antifuse element is higher or lower than the known value of resistance. The method and apparatus are useful in verifying the programming of antifuse elements.
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