- 专利标题: Method and system for calibrating a laser processing system and laser marking system utilizing same
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申请号: US10438533申请日: 2003-05-15
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公开(公告)号: US07015418B2公开(公告)日: 2006-03-21
- 发明人: Steven P. Cahill , Jonathan S. Ehrmann , You C. Li , Rainer Schramm , Kurt Pelsue
- 申请人: Steven P. Cahill , Jonathan S. Ehrmann , You C. Li , Rainer Schramm , Kurt Pelsue
- 申请人地址: US MA Billerica
- 专利权人: GSI Group Corporation
- 当前专利权人: GSI Group Corporation
- 当前专利权人地址: US MA Billerica
- 代理机构: Brooks Kushman P.C.
- 主分类号: B23K26/00
- IPC分类号: B23K26/00
摘要:
A method of calibrating a laser marking system includes calibrating a laser marking system in three dimensions. The step of calibrating includes storing data corresponding to a plurality of heights. A position measurement of a workpiece is obtained to be marked. Stored calibration data is associated with the position measurement. A method and system for calibrating a laser processing or marking system is provided. The method includes: calibrating a laser marker over a marking field; obtaining a position measurement of a workpiece to be marked; associating stored calibration data with the position measurement; relatively positioning a marking beam and the workpiece based on at least the associated calibration data; and calibrating a laser marking system in at least three degrees of freedom. The step of calibrating includes storing data corresponding to a plurality of positions and controllably and relatively positioning a marking beam based on the stored data corresponding to the plurality of positions.
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