发明授权
US07028123B2 Microcomputer, has selection circuit to select either testing-purpose interrupt request signal or interrupt request selection signal based on delayed selection signal, where selected signals are sent to interrupt controller
失效
微机具有选择电路，根据延迟选择信号选择测试用途中断请求信号或中断请求选择信号，其中所选择的信号被发送到中断控制器
- 专利标题： Microcomputer, has selection circuit to select either testing-purpose interrupt request signal or interrupt request selection signal based on delayed selection signal, where selected signals are sent to interrupt controller
- 专利标题（中）： 微机具有选择电路，根据延迟选择信号选择测试用途中断请求信号或中断请求选择信号，其中所选择的信号被发送到中断控制器
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申请号： US10411222申请日： 2003-04-11
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公开(公告)号： US07028123B2公开(公告)日： 2006-04-11
- 发明人: Takehiko Shimomura
- 申请人： Takehiko Shimomura
- 申请人地址： JP Tokyo
- 专利权人： Renesas Technology Corp.
- 当前专利权人： Renesas Technology Corp.
- 当前专利权人地址： JP Tokyo
- 代理机构： Buchanan Ingersoll PC
- 优先权： JP2002-322320 20021106
- 主分类号： G06F13/24
- IPC分类号： G06F13/24
摘要：
In a microcomputer, a testing-purpose interrupt request signal generator generates a testing-purpose interrupt request signal, an interrupt request selecting register stores an interrupt request selection signal for making an interrupt request during testing effective, and at least one delay circuit generates one or more delayed interrupt request selection signals obtained by delaying the interrupt request selection signal by one or more delay times. Each of selection circuits selects either one of the interrupt request signals or the testing-purpose interrupt request signal based on the delayed interrupt request selection signal. The testing-purpose interrupt request signals output from the respective selection circuits at a different timing, can be sequentially input to the interrupt controller.
公开/授权文献
- US20040088461A1 Microcomputer 公开/授权日：2004-05-06