发明授权
US07038272B2 Method for forming a channel zone of a transistor and NMOS transistor
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用于形成晶体管和NMOS晶体管的沟道区的方法
- 专利标题: Method for forming a channel zone of a transistor and NMOS transistor
- 专利标题(中): 用于形成晶体管和NMOS晶体管的沟道区的方法
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申请号: US10631350申请日: 2003-07-31
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公开(公告)号: US07038272B2公开(公告)日: 2006-05-02
- 发明人: Hans Weber , Dirk Ahlers , Uwe Wahl , Jenö Tihanyi , Armin Willmeroth
- 申请人: Hans Weber , Dirk Ahlers , Uwe Wahl , Jenö Tihanyi , Armin Willmeroth
- 申请人地址: DE Munich
- 专利权人: Infineon Technologies AG
- 当前专利权人: Infineon Technologies AG
- 当前专利权人地址: DE Munich
- 代理商 Laurence A. Greenberg; Werner H. Stemer; Ralph E. Locher
- 优先权: DE10235000 20020731
- 主分类号: H01L29/76
- IPC分类号: H01L29/76
摘要:
In a method for forming a channel zone in field-effect transistors, a polysilicon layer is patterned above the channel zone to be formed. The polysilicon layer serves as a mask substrate for the subsequent doping of the channel zone. The expedient patterning of the polysilicon layer with holes in a gate region and pillars in a source region enables the channel zone to be doped more lightly. In another embodiment, the novel method is used for a channel width shading of a PMOS transistor cell.
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