发明授权
- 专利标题: Soft-error rate hardened pulsed latch
- 专利标题(中): 软错误率硬化脉冲锁存器
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申请号: US10741560申请日: 2003-12-19
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公开(公告)号: US07038515B2公开(公告)日: 2006-05-02
- 发明人: Stefan Rusu , Peter Hazucha , Tanay Karnik
- 申请人: Stefan Rusu , Peter Hazucha , Tanay Karnik
- 申请人地址: US CA Santa Clara
- 专利权人: Intel Corporation
- 当前专利权人: Intel Corporation
- 当前专利权人地址: US CA Santa Clara
- 代理机构: Schwegman, Lundberg, Woessner & Kluth, P.A.
- 主分类号: H03K3/356
- IPC分类号: H03K3/356
摘要:
A latch includes a memory unit, a transfer unit, an inversion unit, and an output unit. The Memory unit includes a number of storage nodes. The transfer unit transfers a data from a data input node to the storage nodes via a plurality of data paths. Each of the data paths includes a pass element controlled by a pulse. The inversion unit inverts the data before the data is transferred from the data input node to at least one of the storage nodes. The output unit outputs the data from the memory unit to a latch output node. The memory unit, the transfer unit, the inversion unit, and the output unit of the latch form a soft-error rate hardened latch structure with a reduced number of elements and reduced power consumption.
公开/授权文献
- US20050134347A1 Soft-error rate hardened pulsed latch 公开/授权日:2005-06-23
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