- 专利标题: Epitaxial semiconductor deposition methods and structures
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申请号: US10993024申请日: 2004-11-18
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公开(公告)号: US07115521B2公开(公告)日: 2006-10-03
- 发明人: Paul D. Brabant , Joseph P. Italiano , Chantal J. Arena , Pierre Tomasini , Ivo Raaijmakers , Matthias Bauer
- 申请人: Paul D. Brabant , Joseph P. Italiano , Chantal J. Arena , Pierre Tomasini , Ivo Raaijmakers , Matthias Bauer
- 申请人地址: US AZ Phoenix
- 专利权人: ASM America, Inc.
- 当前专利权人: ASM America, Inc.
- 当前专利权人地址: US AZ Phoenix
- 代理机构: Knobbe, Martens, Olson & Bear LLP
- 主分类号: H01L21/302
- IPC分类号: H01L21/302 ; H01L21/461
摘要:
Methods for depositing epitaxial films such as epitaxial Ge and SiGe films. During cooling from high temperature processing to lower deposition temperatures for Ge-containing layers, Si or Ge compounds are provided to the substrate. Smooth, thin, relatively defect-free Ge or SiGe layers result. Retrograded relaxed SiGe is also provided between a relaxed, high Ge-content seed layer and an overlying strained layer.
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