Invention Grant
US07119331B2 Nanoparticle ion detection 有权
纳米粒子离子检测

Nanoparticle ion detection
Abstract:
A nanoparticle ion detector includes an ion trap that receives charged particles ejected from a mass selection device. A laser beam illuminates the particles to induce fluorescence, which is detected by the photon detector. Particles are periodically dumped from the ion trap. A mass spectrum of the charged particles can be obtained by comparing signals from the photon detector with the particle ejection characteristics of the mass selection device.
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