Invention Grant
- Patent Title: Nanoparticle ion detection
- Patent Title (中): 纳米粒子离子检测
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Application No.: US10726071Application Date: 2003-12-01
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Publication No.: US07119331B2Publication Date: 2006-10-10
- Inventor: Huan-Cheng Chang , Wen-Ping Peng , Yong Cai
- Applicant: Huan-Cheng Chang , Wen-Ping Peng , Yong Cai
- Applicant Address: TW Taipei
- Assignee: Academia Sinica
- Current Assignee: Academia Sinica
- Current Assignee Address: TW Taipei
- Agency: Fish & Richardson P.C.
- Priority: TW92125852A 20030919
- Main IPC: B01D59/44
- IPC: B01D59/44

Abstract:
A nanoparticle ion detector includes an ion trap that receives charged particles ejected from a mass selection device. A laser beam illuminates the particles to induce fluorescence, which is detected by the photon detector. Particles are periodically dumped from the ion trap. A mass spectrum of the charged particles can be obtained by comparing signals from the photon detector with the particle ejection characteristics of the mass selection device.
Public/Granted literature
- US20050029448A1 Nanoparticle ion detection Public/Granted day:2005-02-10
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