Invention Grant
- Patent Title: Method for production of a semiconductor structure
- Patent Title (中): 半导体结构的制造方法
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Application No.: US11065342Application Date: 2005-02-25
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Publication No.: US07141507B2Publication Date: 2006-11-28
- Inventor: Oliver Genz , Markus Kirchhoff , Stephan Machill , Alexander Reb , Barbara Schmidt , Momtchil Stavrev , Maik Stegemann , Stephan Wege
- Applicant: Oliver Genz , Markus Kirchhoff , Stephan Machill , Alexander Reb , Barbara Schmidt , Momtchil Stavrev , Maik Stegemann , Stephan Wege
- Applicant Address: DE München
- Assignee: Infineon Technologies AG
- Current Assignee: Infineon Technologies AG
- Current Assignee Address: DE München
- Agency: Morrison & Foerster LLP
- Priority: DE10240099.7 20020830
- Main IPC: H01L21/302
- IPC: H01L21/302

Abstract:
A method for producing a semiconductor structure including preparing a semiconductor substrate, and generating a lower first, a middle second and an upper third masking layer on a surface of the semiconductor substrate. The method further includes forming at least one first window in the upper third masking layer, structuring the middle second masking layer using the first window for transferring the first window, structuring the lower first masking layer using the first window for transferring the first window, and enlarging the first window to form a second window. The method for further includes restructuring the middle second masking layer using the second window for transferring the second window, structuring the semiconductor substrate, using the structured lower third masking layer, restructuring the lower first masking layer using the second window, and restructuring the semiconductor substrate using the restructured lower third masking layer.
Public/Granted literature
- US20050196952A1 Method for production of a semiconductor structure Public/Granted day:2005-09-08
Information query
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