Invention Grant
- Patent Title: Floating gate and fabricating method thereof
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Application No.: US10764037Application Date: 2004-01-23
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Publication No.: US07205603B2Publication Date: 2007-04-17
- Inventor: Ying-Cheng Chuang , Chung-Lin Huang , Chi-Hui Lin
- Applicant: Ying-Cheng Chuang , Chung-Lin Huang , Chi-Hui Lin
- Applicant Address: TW Taoyuan
- Assignee: Nanya Technology Corporation
- Current Assignee: Nanya Technology Corporation
- Current Assignee Address: TW Taoyuan
- Agency: Ladas & Parry LLP
- Priority: TW91116930A 20020729
- Main IPC: H01L29/788
- IPC: H01L29/788

Abstract:
A floating gate and fabrication method thereof. A semiconductor substrate is provided, on which an oxide layer, a first conducting layer, and a patterned hard mask layer having an opening are sequentially formed. A spacer is formed on the sidewall of the opening. A second conducting layer is formed on the hard mask layer. The second conducting layer is planarized to expose the surface of the patterned hard mask layer. The surface of the second conducting layer is oxidized to form an oxide layer. The patterned hard mask layer and the oxide layer and the first conducting layer underlying the patterned hard mask layer are removed.
Public/Granted literature
- US20040152266A1 Floating gate and fabricating method thereof Public/Granted day:2004-08-05
Information query
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